Subtitle/Subject |
Magnetism of ultrathin films studied by the soft X-ray depth-resolved XMCD and development to a three-dimensional magnetic analysis |
Period |
to Jan 27 , 2006
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Venue |
HOUKOUKAN
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Host/Organizer |
JASRI/SPring-8
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Format |
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Fields |
Materials Science
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Abstract |
Date & Time: 15:00-16:00, January 27, 2005
Speaker: Dr. Kenta Amemiya Affiliation: Graduate School of Science, The University of Tokyo
Abstract It is inevitable to separate the surface and interface magnetism from that of the inner layers in order to understand the magnetic property of ultrathin films. We have recently developed a soft X-ray depth-resolved XMCD technique, where a set of the electron yield XMCD spectra with different probing depths are obtained by using the fact that the effective escape depth of the electrons can be controlled by the electron emission angle. The principle of the technique and its applications to ultrathin magnetic films are presented, together with a three-dimensional magnetic analysis project, in which the depth-resolved technique is combined with a soft X-ray microbeam.
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Contact Address |
Yuuji Saitoh(PHS 3818)
JAERI/SPring-8
+81-(0)791-58-2601
ysaitoh@spring8.or.jp
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Last modified
2009-05-27 12:36