Priority Research Proposals 2004A: Trial Use Proposals
CONTACT: SPring-8 Users Office; sp8jasri@spring8.or.jp
| S/N | Proposal No. | Title of Experiment | Project Leader | Affiliation | Country | BL | Shifts |
| 1 | 2004A0140-NI-np-TU | Study on the fiber structure by using ultra small angle X-ray scattering | Hiroki Murase | TOYOBO Reserach Center Co.,Ltd. | Japan | BL19B2 | 6 |
| 2 | 2004A0146-NI-np-TU | Small Area Stress Measurement of W Plug for LSI | Shinji Ozaki | Matsushita Technoresearch, Inc. | Japan | BL46XU | 9 |
| 3 | 2004A0183-NI-np-TU | Local structural analysis of Ti-incorporated layered double hydroxides with high photocatalytic activity induced by visible-light | Atsushi Nakahira | Kyoto Institute of Technology | Japan | BL19B2 | 3 |
| 4 | 2004A0237-NI-np-TU | Studies on Fe distribution and its electric structures in polycrystalline silicon by µ-XRF and µ-XAFS | Yoshio Ohshita | Toyota Technological Institute | Japan | BL37XU | 6 |
| 5 | 2004A0238-NI-np-TU | Radial distribution measurement of low-k film using grazing incidence X-ray scattering method. | Takashi Suzuki | Fujitsu Laboratories | Japan | BL46XU | 6 |
| 6 | 2004A0257-NI-np-TU | Development of in-situ observation technique on solidification structure of weld metals by X-ray diffraction | Mitsuharu Yonemura | Sumitomo Metal Industries, Ltd. | Japan | BL46XU | 9 |
| 7 | 2004A0281-NI-np-TU | Structural Analysis of High Dielectric Constant Materials by XAFS Measurement | Hideki Satake | Toshiba Corporation | Japan | BL01B1 | 6 |
| 8 | 2004A0288-NI-np-TU | Investigation of local structure of Er-doped silicate glasses for optical amplifier | Jun Sasai | Asahi Glass Company | Japan | BL01B1 | 3 |
| 9 | 2004A0326-NI-np-TU | Study on molecular tilting of polymide film for Liquid Crystal Display Device by Grazing Incidence X-ray Scattering | Junichiro Yokota | Chisso Corporation | Japan | BL19B2 | 9 |
| 10 | 2004A0335-NI-np-TU | Structure Analysis of Organic Self-Assembled Monolayers by GID | Katsuhiko Tani | Ricoh Company, Ltd. | Japan | BL19B2 | 6 |
| 11 | 2004A0340-NI-np-TU | Structural analysis of amorphous film of Diamond-like-Carbon by Grazing Incidence X-ray Scattering | Tadashi Hamada | Matsushita Electric Works, Ltd. | Japan | BL19B2 | 9 |
| 12 | 2004A0403-NI-np-TU | XAFS study on ultra dilute dopants in ZnO based ceramics | Hiroki Moriwake | Matsushita Electric Components Co., Ltd. | Japan | BL01B1 | 6 |
| 13 | 2004A0467-NI-np-TU | Valence analysis of various ions at the surface of float glass | Yasuyuki Takimoto | Asahi Glass Company | Japan | BL19B2 | 3 |
| 14 | 2004A0499-NXb-np-TU | Analytical methods of ultra low concentrations of Metals in high chloride solutions | Toshihiko Taniuchi | YAKIN Kawasaki Co., Ltd. | Japan | BL37XU | 3 |
| 15 | 2004A0531-NI-np-TU | XAFS investigations on the local structures of Pt loaded zeolite oxidation catalysts used for various electric appliances | Masaya Matsuoka | Osaka PrefectureUniversity | Japan | BL19B2 | 3 |
| 16 | 2004A0540-NI-np-TU | Radial Distribution functions of HfAlxOy thin films | Ichiro Hirosawa | JASRI | Japan | BL46XU | 6 |
| 17 | 2004A0579-NI-np-TU | Determination of the XAFS measurement technique of the doped luminous site in fluorescent materials | Tetsuo Honma | JASRI | Japan | BL01B1 | 12 |
| 18 | 2004A0581-NI-np-TU | Structural Analysis of Passive Film on Iron Surface by Grazing Incidence X-Ray Scattering Method | Masato Yamashita | University of Hyogo | Japan | BL46XU | 9 |
| 19 | 2004A0586-NI-np-TU | XAFS investigations of Titanium Oxide Thin Film Prepared by a novel sol-gel method | Tatsuya Imura | Kawasaki Heavy Industries, Ltd. | Japan | BL19B2 | 3 |
| 20 | 2004A0615-NI-np-TU | X-ray study on the adsorption of perfluoro molecule and surface characterization | Yasuo Sakane | Matsumura Oil Research Corp. | Japan | BL19B2 | 9 |
| 21 | 2004A0788-RI-np-TU | XAFS study on the local structure of rare metals (La, Ce) catalyst loaded on pentasil-type zeolite | Noboru Saitou | Nippon Shokubai Co.,Ltd. | Japan | BL19B2 | 3 |
| 22 | 2004A0789-RI-np-TU | Study of method for analyzing substitution site of activator atom in the crystal structure of Ce-doped Gd2SiO5 scintillator materials | Yasuhiro Yagi | Hitachi Chemical Co., Ltd. | Japan | BL19B2 | 6 |
| 23 | 2004A0792-RI-np-TU | Analysis of the heat stress which act on the element mounted on the substrate in the rejin molding by X ray analysis measurement | Hideki Ichii | Sanso Electric Co., Ltd. | Japan | BL19B2 | 6 |
| 24 | 2004A0794-RI-np-TU | Investigation into correlation between electrostatic capacity and crystallization of Activated Carbon | Shuushi Nishimura | Kuraray Chemical Co., Ltd. | Japan | BL19B2 | 3 |
| 25 | 2004A0795-RI-np-TU | Structural Analysis for Efflorescence Materials on Polymercement by X-ray Diffraction | Keiko Miyashita | Ozeki Chemical Laboratory Co., Ltd. | Japan | BL19B2 | 6 |
| 26 | 2004A0801-RI-np-TU | Influence of degree of crystallinity at the surface of the alignment layer on alignmentability of liquid crystal | Takahiro Sakai | Nissan Chemical Industries, Ltd. | Japan | BL19B2 | 9 |
| 27 | 2004A0802-RI-np-TU | Structural analysis of ribbon-shape MgxPd100-x amorphous alloys by X-ray scattering and XAFS | Tadashi Hamada | Matsushita Electric Works, Ltd. | Japan | BL19B2 | 9 |
| 28 | 2004A0810-RI-np-TU | Investigation of local structure of Er-doped silicate glasses for optical amplifier | Jun Sasai | Asahi Glass Company | Japan | BL19B2 | 3 |
| 29 | 2004A0814-RI-np-TU | Fe Local structural analysis of activated carbon containing iron hydroxide and analysis of its high ability of arsenic removal | Atsushi Nakahira | Kyoto Institute of Technology | Japan | BL19B2 | 3 |