Research Group:
Spectroscopy Research Group for X-ray Emission and Inelastic X-ray Scattering
Contact:
| Naomi Kawamura |
| 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan |
| Telephone: +81-791-58-0802 |
| naochan (at) spring8.or.jp |
Research Area:
Life Science, Fundamental Characterization, Applied Materials, Measurements
Beamline:
BL11XU, BL12XU, BL33XU, BL36XU, BL39XU
Overview of Research Group, Goals and Purposes:
X-ray emission spectroscopy (XES) and inelastic X-ray scattering (IXS) are experimental techniques utilizing the second order optical process and they are powerful to investigate electronic states for the functional materials because of the element and orbital selectivities. This research group consists of researchers and students aiming to clarify the mechanism of function for the materials by means of the XES/IXS. By analyzing the energies of incident and emitted (scattered) photons with high resolution around 1 eV or below, a variety of unique spectroscopic capabilities emerge, such as observation of occupied electronic states and suppression of life-time broadening in x-ray absorption spectroscopy. The XES/IXS methods have been recently progressing owing to the appearance of third generation synchrotron radiation sources, and are expected as versatile tools for investigating basic physical properties, catalytic science, bioscience, geoscience, eivironment science, and industrial applications in the European and US countries. In the 5th and 6th term, discussions were held on experimental methods and analysis schemes, technical developments and research outcomes, and DX in XES/IXS. In addition to the above activities, the following activities will be promoted in the 7th period to develop advanced techniques for the XES/IXS measurements and to conduct new scientific activities.
- Holding of the conference and workshop on XES/IXS
- Discussion about the results
- Provision of measurement techniques and analytical methods
- Investigation of the trend of use
- Promotion of research activities through training and lectures
- Upgrading of advanced measurement technology for XES/IXS
- Development of multiple measurement system such as measurement under extreme conditions, macroscopic measurement, and X-ray diffraction
- Furtherance of automation of the measurements and data analysis
- Discussion on automation and remote access to improve experiental efficiency
- Realization of high throughput of outcomes by the on-site immediate data analysis
- Discussin of the next application for science toward next generation synchrotron radiation source
- Submission of request from users to SPring-8 for upgrade of beamlines by collaborating with the other SPRUC research groups and scientific societies