概要 |
日 時 : 2005年7月1日 13:30-14:30
講演者 : Dr. Eric Maire 所 属 : CNRS, France
講演要旨 The lecture will review some of the research carried out by the GEMPPM laboratory in the field of using synchrotron radiation to study the microstructure and deformation of structural materials. The main technique used is the imaging by absorption, phase contrast, diffraction and holo tomography. These different aspects of imaging will be illustrated on various systems ranging from metal, polymers and ceramics, composites and cellular materials. In situ sollicitation in temperature, by tension or compression monotonous and fatigue loading will also be presented. The lecture will emphasize the description of the techniques and also the use of the images once they are obtained, by 3D image processing, FE Based modelling, strain field measurement through digital image correlatioon or tracking of particles... X-ray microdiffraction results will be shown to have been coupled with success to imaging in the case of Ti-SiC MMCs.
|