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SPring-8セミナー(第144回)

副題/演題 X-ray Micro-/Nano-Diffraction: Domains, Defects, and Dislocation Boundaries
開催期間 2005年07月25日
開催場所 上坪講堂
主催 (財)高輝度光科学研究センター
形式 レクチャー(講演)
概要

日   時 : 2005年7月25日 10:30-

講演者 : Dr. Zhonghou Cai
所   属 : Advanced Photon Source

講演要旨
  Inhomogeneity in material is a very common aspect associated with natural/non-natural processes of materials synthesis and fabrication. The understanding of its generic nature is underway, which is creating waves of information that will impact our technology. In the world of micro/nanostructures, domains of various physical and chemical entities have been the grand quests for many years and today X-ray micro/nanodiffraction, with its high structural sensitivity, has become one of the practical means to this end. Combining advanced microfocusing capability with the high brilliance of a synchrotron radiation source, X-ray microdiffraction allows spatially resolved studies of crystallographic phases, microstructures, superstructures, and collective electronic phenomena. In this talk I will explore the paths to characterize domains of antiferromagnetism and ferroelectricity, depinning of the charge-density wave pinned to the defects of the underlying lattice, induced strain fields in substrate crystals and thin films by epitaxial microfeatures and dislocation boundaries, and internal structures of individual nanomaterials.

問い合わせ先 木村 滋 (PHS 3726) (財)高輝度光科学研究センター


kimuras@spring8.or.jp
最終変更日 2009-05-27 12:36