大型放射光施設 SPring-8

Speaker: Dr. Nozomi Shirato

Language: English

Affiliation: Argonne National Laboratory

Title: XTIP – A dedicated beamline for synchrotron X-ray scanning tunneling microscopy

Abstract:
　Advancements of scanning probe microscopy have been contributing to broaden fundamental understanding of surface physics. By combining high intense X-ray beam as a probe and a functionalized tip as a detector, synchrotron X-ray scanning tunneling microscopy (SX-STM) has been developed at Advanced Photon Source in Argonne National Laboratory. The recent studies demonstrated the technique has capabilities to extract chemical information with sensitivity at the atomic limit ^[1] and localized magnetic contrast by utilizing polarized beams ^[2]. At APS, in order to fully exploit potentials of the microscope, a dedicated beamline is under construction and close to see a first light. Equipped with a polarizer and focusing optics, the soft X-ray beamline can produce a photon flux of 10¹¹-10¹³ photons/sec at 1 keV over the energy range of 500 to 1600 eV. A spherical grating monochromator will deliver a resolving power better than 4000. The capabilities of the beamline will benefit the communities to explore chemical, magnetic and electronic properties of materials at atomic resolution.

References
[1] N. Shirato et al., Nano Letters 14, 6499 (2014).
[2] A. DiLullo et al., J. Synchrotron Rad. 23, 574 (2016).

担当者: 中村　哲也
e-mail: nakaspring8.or.jp
PHS: 3244