大型放射光施設 SPring-8

Speaker: Dr. Olena Fedchenko

Language: English

Affiliation: Johannes Gutenberg University of Mainz

Title: Implementation of Hard X-ray Time-of-Flight Momentum Microscopy for Structural Analysis

Abstract:
Time-of-flight momentum microscopy (ToF-MM) is a powerful technique for the comprehensive study of the electronic and geometrical structure of complex materials. UV, soft- and hard X-rays can be used as photon sources for this photoemission experiment. This talk will focus on the implementation of ToF-MM and hard X-rays for structure analysis of solids. I will present several experimental results in combination with calculations based on the Bloch-wave approach. In particular, I will show how hard X-ray photoelectron diffraction (hXPD) and X-ray photoelectron spectroscopy (XPS) have been used to study missing inversion symmetry in thin films with zinc-blende structure (GaAs); to observe structural phase transitions (Mo1-xWxTe2, SrTiO3); to analyse dopant and impurity sites (Te-hyperdoped Si); to study valence transitions (EuPd2Si2). Experimental results were obtained at the hard X-ray beamline P22 of PETRA III (DESY, Hamburg).