BL04B2 Two-axis diffractometer
問い合わせ番号
INS-0000000305
Two-axis diffrractometer for high-energy X-ray diffraction of disordered materials
The two-axis diffractometer for glass, liquid, and amorphous materials (Fig. 1) is installed to measure total structure factor S(Q) up to high Q, providing high real space resolution in Fourier transformed function. The diffractometer was designed with a horizontal scattering plane for an easier use of heavy equipment, although horizontal scattering plane has the disadvantage of the polarization factor for large scattering angle. In high-energy X-ray diffraction (E > 30 keV), however, the experiment can be performed in the rather small angle region where the polarization factor is not so significant.
- Table 1. The specification of two-axis diffractometer installed at BL04B2
2θ arm 2main -10 ∼ 150° Δθ = 0.001 2sub -120 ∼ 10° Δθ = 0.001 Sample stage θ -180 ∼ 180° Δθ = 0.001 X ± 10 mm Y ± 10 mm Z ± 10 mm Rx ± 3° Ry ± 3° Collimator Xc ± 10 mm Zc ± 10 mm Rcy ± 10° Rcz ± 180° Xt ± 15 mm - Table 2. Available photon energies and accessible Q range
Photon energy (keV) Accessible Q range (Å-1) 37.8 keV (Si 111) 0.1 ∼ 22 61.7 keV (Si 220) 0.16 ∼ 36 113.3 keV (Si 333*) 0.3 ∼ 40 *obtained with 3rd harmonic of Si 111 reflection
- Fig.1. A two-axis diffractometer installed at BL04B2 [1](a) Ionization chamber,
(b) Incident slit.(c) θ stage,(d) Vacuum chamber,(e) Beam stop,(f) Receiving slits,(g) 2θ arm,(h) Ge detector
Fig.2. Total structure factors, S(Q), of typical oxide glasses [1, 2] 
Fig.3. High-temperature furnace(∼ 1200°C) for a two-axis diffractometer
References
- S. Kohara, K. Suzuya, Y. Kashihara, N. Matsumoto, N. Umesaki, and I. Sakai, Nucl. Instr. and Meth. A 467-468, 1030 (2001).
- S. Kohara and K. Suzuya: Nucl. Instr. and Meth. B, 199 (2003) 23.