問い合わせ番号

INS-0000000305

Two-axis diffrractometer for high-energy X-ray diffraction of disordered materials

  The two-axis diffractometer for glass, liquid, and amorphous materials (Fig. 1) is installed to measure total structure factor S(Q) up to high Q, providing high real space resolution in Fourier transformed function. The diffractometer was designed with a horizontal scattering plane for an easier use of heavy equipment, although horizontal scattering plane has the disadvantage of the polarization factor for large scattering angle. In high-energy X-ray diffraction (E > 30 keV), however, the experiment can be performed in the rather small angle region where the polarization factor is not so significant.

• Table 1. The specification of two-axis diffractometer installed at BL04B2

  2θ arm	2main	-10 ∼ 150°	Δθ = 0.001
  	2sub	-120 ∼ 10°	Δθ = 0.001
  Sample stage	θ	-180 ∼ 180°	Δθ = 0.001
  	X	± 10 mm
  	Y	± 10 mm
  	Z	± 10 mm
  	Rx	± 3°
  	Ry	± 3°
  Collimator	Xc	± 10 mm
  	Zc	± 10 mm
  	Rcy	± 10°
  	Rcz	± 180°
  	Xt	± 15 mm

• Table 2. Available photon energies and accessible Q range

  Photon energy (keV)	Accessible Q range (Å-1)
  37.8 keV (Si 111)	0.1 ∼ 22
  61.7 keV (Si 220)	0.16 ∼ 36
  113.3 keV (Si 333*)	0.3 ∼ 40

  *obtained with 3rd harmonic of Si 111 reflection

  
  Fig.1. A two-axis diffractometer installed at BL04B2 [1](a) Ionization chamber,
  (b) Incident slit.(c) θ stage,(d) Vacuum chamber,(e) Beam stop,(f) Receiving slits,(g) 2θ arm,(h) Ge detector
  
  
  Fig.2. Total structure factors, S(Q), of typical oxide glasses [1, 2]
  

  Fig.3. High-temperature furnace(∼ 1200°C) for a two-axis diffractometer

References

1. S. Kohara, K. Suzuya, Y. Kashihara, N. Matsumoto, N. Umesaki, and I. Sakai, Nucl. Instr. and Meth. A 467-468, 1030 (2001).
2. S. Kohara and K. Suzuya: Nucl. Instr. and Meth. B, 199 (2003) 23.