問い合わせ番号

INS-0000000384

ABSTRACT

  This beamline, together with its sister beamline BL16XU, is a contract beamline designed and constructed by an industrial consortium of 13 companies to characterize various materials for industrial purpose. The main experiments on this beamline are XAFS, X-ray topography, X-ray imaging and X-ray diffraction. The energy range from the titanium K-edge to the thulium K-edge is covered. .

AREA OF RESEARCH

• Characterization of various industrial materials for secondary batteries, fuel cells, catalysts, steels, semiconductors, optical and magnetic devices and others.

KEYWORDS

• Scientific field
  XAFS, Topography, X-ray reflectivity, X-ray fluorescent analysis, X-ray imaging
• Equipment
  25-element SSD, Lytle type detector, conversion electron yield detector, X-ray diffractometer, scintillation detector, two-dimensional detector, X-ray imaging cameras, cryostat, reactive gas equipment for in-situ measurement (shared with BL16XU), glovebox (shared with BL16XU)

SOURCE AND OPTICS

• X-rays at sample

  Energy range	4.5 ∼ 113 keV
  Energy resolution	ΔE/E ∼ 10-4
  Photon flux	∼ 1010ph/s
  Beam size	~ 0.1(H) × 0.1(V) (with mirror) ~ 40(H) × 2(V) (without mirror)

  

  Schematic View of Beamline

  

  Photograph of beamline BL16B2 and BL16XU

EXPERIMENTAL STATIONS

A large experimental table and a 6-axis X-ray diffractometer are installed in BL16B2 experimental hutch.

• Experimental table (Fig. 1)
  • Various measurements (XAFS, topography, X-ray imaging and others) can be carried out.
  • XAFS measurements in transmission, fluorescence and conversion electron yield modes can be available.
  • 25-element SSD can be used for low concentration elements.
  • In-situ XAFS measurement under flammable and some toxic gas condition can be carried out by using reactive gas equipment.
  • X-ray imaging measurements can be carried out with using various types of detectors such as an X-ray CCD camera, a CMOS camera and a flat panel detector.
    

    Fig. 1 Experimental table and 25-element SSD

• X-ray diffractometer (Fig. 2)
  • A 6-axis diffractometer is installed and used for X-ray diffraction, X-ray reflectivity, grazing incidence X-ray scattering and others.
  • Various types of detectors such as NaI (Tl), YAP (Ce) scintillation counter, one-dimensional detector (Mythen) and two-dimensional detector (PILATUS 100K and 300K) are available.
    

    Fig. 2 X-ray diffractometer

PUBLICATION SEARCH

* Sorry, Some parts of results are displayed using Japanese characters.

BL16B2 PUBLICATION SEARCH

CONTACT INFORMATION


Yoshihiro KUDO
R&D Center, Sony Corporation
4-14-1, Asahi-cho, Atsugi-shi, Kanagawa, 243-0014 Japan
Phone: +81-50-3140-0424
e-mail: Yoshihiro.Kudosony.com



Website

https://sunbeam.spring8.or.jp/