Studying of generation process of Pd cluster in zeolite
Inquiry number
SOL-0000001010
Beamline
BL28B2 (White Beam X-ray Diffraction)
Scientific keywords
A. Sample category | inorganic material |
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B. Sample category (detail) | metal, alloy |
C. Technique | absorption and its secondary process |
D. Technique (detail) | XAFS, EXAFS, XANES |
E. Particular condition | high-T (~500 C), time-resolved (slow) |
F. Photon energy | X-ray (4-40 keV) |
G. Target information | chemical state, local structure, structure analysis, structural change |
Industrial keywords
level 1---Application area | environment, Chemical product |
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level 2---Target | catalysis |
level 3---Target (detail) | |
level 4---Obtainable information | interatomic distance, local structure, chemical state |
level 5---Technique | XAFS |
Classification
A80.34 catalysis, M40.10 XAFS
Body text
In this solution, Energy-dispersive XAFS (DXAFS) was applied to Pd cluster loaded on H-ZSM5 during temperature-programmed heating in a H2 flow to analyze Pd K-edge EXAFS spectra. DXAFS is a powerful tool for studying dynamic structural changes of materials during chemical reactions. Using this technique, it becomes possible to obtain XAFS spectrum with time resolution of less than 1 second. These data reveal the fact that the stable metal Pd6 clusters was generated on the zeolite in a reduction atmosphere.
Figure. Pd K-edge EXAFS Fourier transforms for Pd loaded on H-ZSM5 measured in H2 flow.
[ K. Okumura, R. Yoshimoto, T. Uruga, H. Tanida, K. Kato, S. Yokota and M. Niwa, The Journal of Physical Chemistry B 108, 6250-6255 (2004), Fig. 5(b), 7(a),
©2004 American Chemical Society ]
Source of the figure
Original paper/Journal article
Journal title
Journal of Physical Chemistry B 108(2004)6250
Figure No.
5(b),7(a)
Technique
Energy dispersive XAFS (DXAFS) is a powerful technique to study of dynamic structural changes of materials. The technique is applicable to materials during chemical or physical reactions and provides knowledge about a reaction intermediate and the generation process of materials.
Source of the figure
Private communication/others
Description
Required time for experimental setup
6 hour(s)
Instruments
Instrument | Purpose | Performance |
---|---|---|
Energy-dispersive XAFS | Time resoived XAFS measurement | energy region:7-40keV, time resolution:tens of milliseconds to seconds |
References
Document name |
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Journal of Physical Chemistry B 108(2004)6250 |
Related experimental techniques
Questionnaire
This solution is an application of a main instrument of the beamline.
Ease of measurement
Middle
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Less than one shift