ナビゲーション


BL35XU Inelastic x-ray scattering (IXS) spectrometer

問い合わせ番号

INS-0000001397

Inelastic x-ray scattering (IXS) spectrometer

  • Introduction & energy resolution


      Currently the following setups are available. The use of 12 analyzer crystals allows 12 momentum transfers to be collected in parallel. Changing the energy setup (i.e., the Si reflection order) during the course of an experiment is generally not possible.

    Table of available IXS setup at BL35XU
    Si Ref.Order
    (nnn)
    X-Ray Energy
    (keV)
    λ
    (Å)
    Spectrometer Energy Resolution
    (meV)
    Flux at the sample position*
    (1010 s-1)
    Maximum Q 2θ= 55°
    (nm-1)
    Analyzer Spacing
    0.70° (nm-1)
    Analyzer Acceptance
    (0.12 to 0.54° ) (nm-1)
    (9 9 9) 17.794 0.6968 3.0 ∼ 3 83 1.11 0.21 – 0.85
    (11 11 11) 21.747 0.5701 1.5 〜1 101 1.35 0.25 – 1.04
    * When KB mirror is not installed.
    † Please contact beamline staff if you want 3 meV resolution.

  • Momentum transfer

      12 analyzer crystals mounted in a 4 × 3 (H × V) array provide greatly to the efficiency of the mesasurements, especially for disordered materials, longitudinal phonon modes (horizontal line of analyzers), and transverse modes (vertival line of analyzers). The spacing between them is fixed at 0.70° in two theta. The momentum resolution can be varied on all crystals simultaneously by using motor controlled slits. However, this can change the energy resolution so it should be re-measured at each slit size. Note that the minimum momentum transfer accessible in most setups is ∼ 2 nm-1. Smaller is possible, but may require a special sample container, and may restrict the number of analyzer crystals used. If this is needed, please consult with beamline staff.

  • Sample area and beam size

      The standard mirror gives the spot size of ∼ φ80 µm (FWHM) at the sample position, suitable for small samples and/or high pressure cells. KB mirror is also available (φ20 µm (FWHM)) on request. Note, when you need the KB setup, please add one extra day (3 shifts) to your beam time, that is used for KB installation.
      Samples for IXS may be mounted in an Eulerian cradle (Huber 512.1) or on separate stages. He cryostat (mounted on the Eulerian cradle) is available to control the sample temperature from ∼ 6 K to 800 K. For low Q measurements, users must take great care in choosing window materials and sample mounts in order to reduce backgrounds.

  • Details

      Please also see the beam line web site for the detailed informaiton.

最終変更日
カレンダー