Diffractometer for the normal energy mode
問い合わせ番号
INS-0000001586
Fig. 2 shows the diffractometer for the normal mode installed in Experimental Hutch2. It is composed of apparatus for beam injection, apparatus around sample, sample changer, goniometer and detector.
Figure 2 Diffractometer for the normal mode installed in Experimental Hutch2
(Apparatus for beam injection)
Composed of attenuator unit for adjusting beam intensity, shutter, four-way guard slit and intensity monitor. These are installed in a vacuum chamber.
(Goniometer)
Maximum rotation speed is 240 °/s. The Eccentricity is less than 1 µm, which allows for data collection form micro-crystal.
(Apparatus around sample)
Composed of on-axis microscope, collimator to remove parasitic scattering emitted from the upper stream optics, beam stop, sample light.
(Cryo-cooler)
Both N2 gas and He gas can be used as a cooling gas. Sample can be cooled down to 100 K in the case of N2 as, and to 20 K in the case of He gas.
(Sample changer)
SPACE-II[1] which was developed at SPring-8 is installed. SPACE-II uses Uni-Puck as a sample cassette. Eight Uni-Puck can be set at once. All users are requested to use SPACE-II to avoid unwanted accident while manual mounting and to reduce temperature change caused by entering and exiting the hutch.
[1] Murakami et al., Acta Cryst. D76 (2020) 155-165
(Detector)
Hybrid photon counting detector EIGER 16M (DECTRIS)
Summary about the diffractometer
| Goniometer spindle axis | 240 °/s |
| Goniometer translation axis | X: ± 4.0 mm, Y: ± 20.0 mm, Z: ± 4.0 mm |
| Sample pin | Use sample pins whose base peace is made of metal. Recommend height is 18 mm from the top of the goniometer |
| Minimum camera distance | 180 mm (When the available beam size is limited, camera distance of 120 mm ~ 160 mm can be use. But, modification of setup BL staff is needed.) |
| Cryo-cooler | ≥ 100 K (N2 gas) ≥ 20 K (He gas) |
Specification of EIGER 16M
| Sensitive area | 311.2(W) × 327.8(H) mm2 |
| Total no. of pixels | 4150(W) × 4371(H) pixels |
| Pixel size | 75 × 75 µm2 |
| Frame rate | Max 133 (frame/s) |
Other apparatus
- Silicon drift detector FAST SDD (AMPTEK) for measurement of XAFS spectrum
- Multi-channel analyzer MCA-700 (SEIKO EG&G)
- Stereomicroscope OLYMPUS SZX-10, SZX-16
- Incubator to store sample 4, 20 degree
- Liquid nitrogen Dewar
- Handling tool for Uni-Puck