Grain boundary characterization utilizing high-resolution X-ray CT and SEM/EBSP orientation analysis
利用事例本文
High-resolution X-ray computer tomography is a non-destructive inspection to study micro-defects of inside materials three dimensionally. An elemental mass ratio, i.e. concentration is investigated by the use of a linear absorption coefficient value, which is different from elementals in the X-ray CT. Figures show (a) distribution of gallium concentration obtained by X-ray CT and (b) grain orientation mapping investigated by SEM/EBSP analysis in the same region of a sample surface. High concentrations have been observed on grain boundary with a high misorientation angle that is considered having high energy. Dependence of the concentration on grain boundary character is revealed.
学術利用キーワード
| A. 試料 | 無機材料 |
|---|---|
| B. 試料詳細 | 金属・合金, 結晶性固体 |
| C. 手法 | 吸収、及びその二次過程 |
| D. 手法の詳細 | |
| E. 付加的測定条件 | 三次元画像計測（ＣＴ等）, 界面, 室温, 時分割（比較的遅い） |
| F. エネルギー領域 | Ｘ線（4～40 keV) |
| G. 目的・欲しい情報 | 局所構造, 欠陥、転位、歪み, 構造変化, 形態・巨視的構造 |
産業利用キーワード
| 階層1 | 機械, 金属, 工業材料 |
|---|---|
| 階層2 | 構造材（鉄、非鉄） |
| 階層3 | |
| 階層4 | 亀裂、空隙, 内部構造, 形態 |
| 階層5 | イメージング |
問い合わせ番号
SOL-0000004508
最終変更日