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BL01B1 OUTLINE

問い合わせ番号

INS-0000000375

ABSTRACT

  This beamline is designed for the transmission mode XAFS measurements using ionization chambers. The various applications of XAFS can be done in the energy range of 3.8 - 113 keV.
  Using the cryostat and furnaces, the sample temperature can be controlled in the range of 4 - 1070 K. A Lytle type detector and 19-element Ge solid-state detector are available for the measurement of the excited spectra. A conversion electron yield detector is available for layered synthetic materials and bulk sample. A θ-2θ stage is used for glancing-angle XAFS measurements. A PILATUS 100K detector is available for depth-resolved XAFS measurements. Time resolved quick XAFS measurements can be performed with time resolution more than 10 sec.

AREA OF RESEARCH

  • XAFS in wide energy region (3.8 to 113 keV)
  • XAFS of dilute systems and thin films
  • Time resolved XAFS by quick scan

KEYWORDS

  • Scientific field
    XAFS, EXAFS, XANES, High energy X-ray (XAFS), Dilute sample, Thin film
  • Equipment
    Cryostat, Furnace, 19-element SSD, CEY detector, θ-2θ stage

SOURCE AND OPTICS

The main optics consists of a first collimating mirror, a fixed-exit double crystal monochromator and a second focusing mirror. The mirrors are rhodium coated.

  • Schematic View of Beamline
  • Optical layout for energy range less than 60 keV
  • X-rays at Sample

    Energy range 3.8 - 113 keV
    Energy resolution ΔE/E = 3 × 10-5 - 2 × 10-4
    Photon flux 109 - 1011 photons/s

EXPERIMENTAL STATIONS

PUBLICATION SEARCH

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BL01B1 PUBLICATION SEARCH

CONTACT INFORMATION

Please note that each e-mail address is followed by "@spring8.or.jp."

Kazuo KATO
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : kkato

Misaki KATAYAMA
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : misaki.katayama

最終変更日
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